Fabrication facilities:
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General cleanroom (0.5 µm optical lithography, fluroine and chlorine RIE, RTA, SEM, AFM, O2 plasma clean, sputterer, scriber, bonders)
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Leica VB6 e-beam lithography (<10 nm resolution, 15 nm stitching and alignment)
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Si cleanroom (chemical cleaning, thermal oxide furnace, PECVD SiO2 and Si3N4, amorphous-Si and Al metalisation)
Measurement Facilities:
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Six Oxford Instruments dilution refrigerators, base temperature ~20 K, magnetic fields up to 18 T and two with rf cabling.
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Four He3 systems with magnets up to 14 T, one with rf cabling
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Numerous He4 cryostats
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Semiconductor parameter analyser, CV profiler