Semiconductor Physics Group

Department of Physics

Semiconductor Physics Group

Dr Rolf Crook

Semiconductor Physics Group, Cavendish Laboratory

Dr Rolf Crook

rc230@cam.ac.uk
Office: +44 (0)1223 337465
Lab: +44 (0)1223 337295
Fax: +44 (0)1223 337271
Office: Room 429, Mott building

Semiconductor Physics
Cavendish Laboratory
J J Thomson Avenue
Madingley Road, Cambridge
CB3 0HE, UK

Research Interests
Low-temperature scanning probes. I have developed and demonstrated three low-temperature scanning-probe techniques for the study of quantum phenomena in low-dimensional electronic devices: erasable electrostatic lithography (EEL), Kelvin probe microscopy (KPM), and scanned gate microscopy (SGM). EEL is a device fabrication technique where measurement and lithography are performed in the same environment [1]. Unlike other fabrication routes, the device can be tuned for optimal performance during fabrication. Patterns of charge are drawn on a GaAs surface with a low-temperature scanning probe biased negative. The pattern of charge is projected to a pattern of depletion in a subsurface 2D electron system where the low-dimensional device is defined. Charge is erased either locally using the probe biased positive, or globally by illuminating the device with red light. The figure shows a KPM (electric potential) image of charge previously drawn using EEL with a 1 micron scale bar. SGM uses the scanning probe tip as a local mobile top-gate and the technique has proven particularly useful for imaging electron density, electron flow, and device disorder.
Low-dimensional quantum devices. I use scanning probe techniques as the tools to investigate quantum properties of low-dimensional electronic devices such as quantum wires [1,2], quantum dots, and quantum billiards [3]. Scanning probes provide spatial information which is often impossible to obtain using any other technique. For example, EEL was used to fabricate a quantum wire and SGM to tune the wire to be electrically symmetric with respect to a DC bias. Electrical symmetry implies geometric symmetry. Once tuned, an additional plateau at 0.5(2e^2/h) was observed, which is shown in the figure. The additional plateau is understood to be caused by the alignment of electron spin within the quantum wire, meaning the formation of a 1D ferromagnetic phase [2]. This significant result means quantum wires may find a major application as sources and detectors of electron spin in future generations of integrated circuits.
Surface acoustic waves. This research is part of the Surface Acoustic Wave (SAW) Quantum Information Processing (QIP) IRC. SAW driven electron transport through a depleted GaAs channel is the basis for a proposed device capable of controlled entanglement and quantum information transfer. The fabrication of such a device will benefit from a detailed understanding of the capture process at the channel entrance and the electron dynamics within the channel. My experiments are designed to obtain spatial information uniquely provided by low-temperature scanning-probe microscopy. Scanned-gate microscopy, which generates images of SAW-induced current, reveals arc-like features confirming that the SAW current is maximized when the maximum potential gradient is minimized [4]. Kelvin-probe microscopy, which generates images of SAW-induced charge, reveals a build up of negative charge at the entrance of the channel when no SAW current flows and a broken line of negative, and occasionally positive, charge when a small SAW current flows.
[1] Erasable electrostatic lithography for quantum components,
R Crook, A C Graham, C G Smith, I Farrer, H E Beere, and D A Ritchie, Nature 424 751 (2003).
[2] Conductance quantization at a half-integer plateau in a symmetric GaAs quantum wire,
R Crook, J Prance, K J Thomas, S J Chorley, I Farrer, D A Ritchie, M Pepper, and C G Smith, Science 312 1359 (2006).
[3] Imaging fractal conductance fluctuations and scarred wave functions in a quantum billiard,
R Crook, C G Smith, A C Graham, I Farrer, H E Beere, and D A Ritchie, Phys. Rev. Lett. 91 246803 (2003).
[4] Scanned-gate microscopy of surface-acoustic-wave induced current,
R Crook, R J Schneble, H E Beere, D A Ritchie, D Anderson, G A C Jones, C G Smith, C J B Ford, and C H W Barnes.
My complete publication list is available below.
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Last modified on 7 November 2006.

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